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Information card for entry 7715666
Preview
| Coordinates | 7715666.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H90 N6 O3 Si8 Yb2 |
|---|---|
| Calculated formula | C30 H90 N6 O3 Si8 Yb2 |
| Title of publication | Formation of <i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethylenediamine <i>via</i> coupling of the two charge reversed C-N bonds of Me<sub>3</sub>NO in the presence of an Eu(II) bis(trimethylsilyl)amide complex. |
| Authors of publication | Li, Yangjuan; Gong, Yu |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 12 |
| Pages of publication | 5342 - 5345 |
| a | 10.661 ± 0.0004 Å |
| b | 11.9772 ± 0.0005 Å |
| c | 12.3171 ± 0.0006 Å |
| α | 118.634 ± 0.005° |
| β | 102.46 ± 0.004° |
| γ | 90.275 ± 0.004° |
| Cell volume | 1337.11 ± 0.12 Å3 |
| Cell temperature | 180 ± 0.1 K |
| Ambient diffraction temperature | 180 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0372 |
| Residual factor for significantly intense reflections | 0.0334 |
| Weighted residual factors for significantly intense reflections | 0.0889 |
| Weighted residual factors for all reflections included in the refinement | 0.0906 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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