Information card for entry 7720963

Structure parameters

• Formula: I Te2 W
• Calculated formula: I Te2 W
• Title of publication: Structural Evolution during Reversible Halogen Intercalation into WTe 2 : Commensurate-Incommensurate WTe 2 I and Multistage WTe 2 Br x (x = 0.5, 1.0 and 1.25)
• Authors of publication: Meyer, Hans-Juergen; Schmidt, Patrick; Romao, Carl
• Journal of publication: Dalton Transactions
• Year of publication: 2026
• a: 6.32004 ± 0.00017 Å
• b: 21.806 ± 0.0006 Å
• c: 3.47132 ± 0.00015 Å
• α: 90°
• β: 90.057 ± 0.003°
• γ: 90°
• Cell volume: 478.4 ± 0.03 ų
• Cell temperature: 150 K
• Ambient diffraction temperature: 150 K
• Number of distinct elements: 3
• Space group number: 11
• Hermann-Mauguin space group symbol: P 1 21/m 1
• Hall space group symbol: -P 2yb
• Residual factor for all reflections: 0.0486
• Residual factor for significantly intense reflections: 0.0386
• Weighted residual factors for significantly intense reflections: 0.0697
• Weighted residual factors for all reflections included in the refinement: 0.0747
• Goodness-of-fit parameter for significantly intense reflections: 1.1499
• Goodness-of-fit parameter for all reflections included in the refinement: 1.1031
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No