Information card for entry 8000050

Structure parameters

• Formula: C28 H38 N2 O2 Si W
• Calculated formula: C28 H38 N2 O2 Si W
• SMILES: [W]1234([Si](C)(C)c5ccc(cc5)C)([n]5ccc(N(C)C)cc5)(C#[O])(C#[O])[c]5([c]4([c]3([c]2([c]15C)C)C)C)C
• Title of publication: Reversible 1,2-Migration of Aryl Groups on Silyl Ligands: Formation and Properties of Silylenetungsten Complexes Stabilized by an External Base
• Authors of publication: Eiji Suzuki; Masaaki Okazaki; Hiromi Tobita
• Journal of publication: Chemistry Letters
• Year of publication: 2005
• Journal volume: 34
• Journal issue: 7
• Pages of publication: 1026
• a: 9.187 ± 0.0002 Å
• b: 9.7027 ± 0.0001 Å
• c: 16.6719 ± 0.0005 Å
• α: 93.026 ± 0.003°
• β: 93.875 ± 0.002°
• γ: 113.821 ± 0.003°
• Cell volume: 1351.17 ± 0.05 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.059
• Residual factor for significantly intense reflections: 0.0571
• Weighted residual factors for significantly intense reflections: 0.1528
• Weighted residual factors for all reflections included in the refinement: 0.1534
• Goodness-of-fit parameter for all reflections included in the refinement: 1.378
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No