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Information card for entry 1100760
Preview
Coordinates | 1100760.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H40 P2 Ru2 Se4 |
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Calculated formula | C46 H40 P2 Ru2 Se4 |
SMILES | [Ru]12345([Se][Se][Ru]6789([Se][Se]1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[cH]1[cH]6[cH]7[cH]8[cH]91)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[cH]1[cH]2[cH]5[cH]4[cH]31 |
Title of publication | Synthesis and Structural Characterization of Some Selenoruthenates and Telluroruthenates |
Authors of publication | Sergey M. Dibrov; Bin Deng; Donald E. Ellis; James A. Ibers |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 3441 - 3448 |
a | 9.5419 ± 0.0014 Å |
b | 11.8807 ± 0.0017 Å |
c | 11.9229 ± 0.0018 Å |
α | 93.561 ± 0.003° |
β | 93.604 ± 0.003° |
γ | 109.951 ± 0.002° |
Cell volume | 1263 ± 0.3 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0686 |
Residual factor for significantly intense reflections | 0.0443 |
Weighted residual factors for significantly intense reflections | 0.1192 |
Weighted residual factors for all reflections included in the refinement | 0.1295 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1100760.html
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