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Information card for entry 1100761
Preview
Coordinates | 1100761.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H20 Ru4 Se6 |
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Calculated formula | C20 H20 Ru4 Se6 |
SMILES | [Ru]1234567([Ru]89%10%11%12%13([Se]2[Se][Ru]2%14%15%16%17%18([Ru]%19%20%21%22([Se]12)([Se]38)([Se]%14[Se]9)[cH]1[cH]%19[cH]%20[cH]%21[cH]%221)[cH]1[cH]%15[cH]%16[cH]%17[cH]%181)[cH]1[cH]%10[cH]%11[cH]%12[cH]%131)[cH]1[cH]4[cH]5[cH]6[cH]71 |
Title of publication | Synthesis and Structural Characterization of Some Selenoruthenates and Telluroruthenates |
Authors of publication | Sergey M. Dibrov; Bin Deng; Donald E. Ellis; James A. Ibers |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 3441 - 3448 |
a | 12.401 ± 0.003 Å |
b | 13.607 ± 0.003 Å |
c | 14.801 ± 0.003 Å |
α | 90° |
β | 110.628 ± 0.003° |
γ | 90° |
Cell volume | 2337.4 ± 0.9 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.054 |
Residual factor for significantly intense reflections | 0.0347 |
Weighted residual factors for significantly intense reflections | 0.0772 |
Weighted residual factors for all reflections included in the refinement | 0.086 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.116 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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