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Information card for entry 1100762
Preview
| Coordinates | 1100762.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C46 H40 P2 Ru2 Te6 |
|---|---|
| Calculated formula | C46 H40 P2 Ru2 Te6 |
| SMILES | [Te]12[Te][Te][Ru]3456([Te]1[Te][Te][Ru]17892([P](c2ccccc2)(c2ccccc2)c2ccccc2)[cH]2[cH]9[cH]8[cH]7[cH]12)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[cH]1[cH]6[cH]5[cH]4[cH]31 |
| Title of publication | Synthesis and Structural Characterization of Some Selenoruthenates and Telluroruthenates |
| Authors of publication | Sergey M. Dibrov; Bin Deng; Donald E. Ellis; James A. Ibers |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2005 |
| Journal volume | 44 |
| Pages of publication | 3441 - 3448 |
| a | 25.211 ± 0.002 Å |
| b | 13.8374 ± 0.0012 Å |
| c | 17.1079 ± 0.0015 Å |
| α | 90° |
| β | 119.506 ± 0.001° |
| γ | 90° |
| Cell volume | 5194.1 ± 0.8 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0697 |
| Residual factor for significantly intense reflections | 0.0426 |
| Weighted residual factors for significantly intense reflections | 0.0932 |
| Weighted residual factors for all reflections included in the refinement | 0.1022 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.975 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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