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Information card for entry 1100762
Preview
Coordinates | 1100762.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H40 P2 Ru2 Te6 |
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Calculated formula | C46 H40 P2 Ru2 Te6 |
SMILES | [Te]12[Te][Te][Ru]3456([Te]1[Te][Te][Ru]17892([P](c2ccccc2)(c2ccccc2)c2ccccc2)[cH]2[cH]9[cH]8[cH]7[cH]12)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[cH]1[cH]6[cH]5[cH]4[cH]31 |
Title of publication | Synthesis and Structural Characterization of Some Selenoruthenates and Telluroruthenates |
Authors of publication | Sergey M. Dibrov; Bin Deng; Donald E. Ellis; James A. Ibers |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 3441 - 3448 |
a | 25.211 ± 0.002 Å |
b | 13.8374 ± 0.0012 Å |
c | 17.1079 ± 0.0015 Å |
α | 90° |
β | 119.506 ± 0.001° |
γ | 90° |
Cell volume | 5194.1 ± 0.8 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0697 |
Residual factor for significantly intense reflections | 0.0426 |
Weighted residual factors for significantly intense reflections | 0.0932 |
Weighted residual factors for all reflections included in the refinement | 0.1022 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.975 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1100762.html
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