Information card for entry 1502790

Structure parameters

• Formula: C34 H44 O Si
• Calculated formula: C34 H44 O Si
• SMILES: [Si]1(C2(Oc3c(cc(cc13)C)C(C)(C)C)c1c(c3c2cc(cc3)C(C)(C)C)ccc(c1)C(C)(C)C)(C)C
• Title of publication: Rational Design of Silicon-Bridged Fluorenyl−Phenoxy Group 4 Metal Complexes as Catalysts for Producing High Molecular Weight Copolymers of Ethylene and 1-Hexene at Elevated Temperature
• Authors of publication: Senda, Taichi; Hanaoka, Hidenori; Nakahara, Shinya; Oda, Yoshiaki; Tsurugi, Hayato; Mashima, Kazushi
• Journal of publication: Macromolecules
• Year of publication: 2010
• Journal volume: 43
• Journal issue: 5
• Pages of publication: 2299
• a: 9.23 ± 0.002 Å
• b: 10.5413 ± 0.0019 Å
• c: 15.742 ± 0.003 Å
• α: 96.051 ± 0.005°
• β: 97.568 ± 0.011°
• γ: 95.234 ± 0.009°
• Cell volume: 1501.2 ± 0.5 ų
• Cell temperature: 113 ± 2 K
• Ambient diffraction temperature: 113 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0663
• Residual factor for significantly intense reflections: 0.0529
• Weighted residual factors for significantly intense reflections: 0.1357
• Weighted residual factors for all reflections included in the refinement: 0.1461
• Goodness-of-fit parameter for all reflections included in the refinement: 1.049
• Diffraction radiation wavelength: 0.71075 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No