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Information card for entry 1515125
Preview
Coordinates | 1515125.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C21 H29 N O4 |
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Calculated formula | C21 H29 N O4 |
SMILES | C1CCCCN1CCCC1(C(=O)OC(C)(C)OC1=O)Cc1ccccc1 |
Title of publication | Low-temperature ketene formation in materials chemistry through molecular engineering |
Authors of publication | Leibfarth, Frank A.; Wolffs, Martin; Campos, Luis M.; Delany, Kris; Treat, Nicolas; Kade, Matthew J.; Moon, Bongjin; Hawker, Craig J. |
Journal of publication | Chemical Science |
Year of publication | 2012 |
Journal volume | 3 |
Journal issue | 3 |
Pages of publication | 766 |
a | 11.21 ± 0.005 Å |
b | 16.029 ± 0.007 Å |
c | 11.499 ± 0.005 Å |
α | 90° |
β | 102.731 ± 0.007° |
γ | 90° |
Cell volume | 2015.4 ± 1.5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0712 |
Residual factor for significantly intense reflections | 0.0451 |
Weighted residual factors for significantly intense reflections | 0.111 |
Weighted residual factors for all reflections included in the refinement | 0.1225 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.175 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1515125.html
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