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Information card for entry 1515126
Preview
Coordinates | 1515126.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C19 H21 N3 O4 |
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Calculated formula | C19 H21 N3 O4 |
SMILES | C1(=O)C(C(=O)OC(C)(C)O1)(C)Cc1cn(Cc2ccc(cc2)C=C)nn1 |
Title of publication | Low-temperature ketene formation in materials chemistry through molecular engineering |
Authors of publication | Leibfarth, Frank A.; Wolffs, Martin; Campos, Luis M.; Delany, Kris; Treat, Nicolas; Kade, Matthew J.; Moon, Bongjin; Hawker, Craig J. |
Journal of publication | Chemical Science |
Year of publication | 2012 |
Journal volume | 3 |
Journal issue | 3 |
Pages of publication | 766 |
a | 17.443 ± 0.004 Å |
b | 21.703 ± 0.005 Å |
c | 9.844 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3726.6 ± 1.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 45 |
Hermann-Mauguin space group symbol | I b a 2 |
Hall space group symbol | I 2 -2c |
Residual factor for all reflections | 0.247 |
Residual factor for significantly intense reflections | 0.1313 |
Weighted residual factors for significantly intense reflections | 0.2684 |
Weighted residual factors for all reflections included in the refinement | 0.307 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.39 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1515126.html
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Users of the data should acknowledge the original authors of the
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