Information card for entry 1515217
| Formula |
C150 H162 N12 O2 Zn2 |
| Calculated formula |
C150 H162 N12 O2 Zn2 |
| Title of publication |
Engineering conjugation in para-phenylene-bridged porphyrin tapes |
| Authors of publication |
Pawlicki, Miłosz; Morisue, Mitsuhiko; Davis, Nicola K. S.; McLean, Daniel G.; Haley, Joy E.; Beuerman, Erich; Drobizhev, Mikhail; Rebane, Aleksander; Thompson, Amber L.; Pascu, Sofia I.; Accorsi, Gianluca; Armaroli, Nicola; Anderson, Harry L. |
| Journal of publication |
Chemical Science |
| Year of publication |
2012 |
| Journal volume |
3 |
| Journal issue |
5 |
| Pages of publication |
1541 |
| a |
11.998 ± 0.002 Å |
| b |
14.379 ± 0.003 Å |
| c |
19.482 ± 0.004 Å |
| α |
82.891 ± 0.006° |
| β |
87.456 ± 0.005° |
| γ |
76.474 ± 0.005° |
| Cell volume |
3242.3 ± 1.1 Å3 |
| Cell temperature |
150 K |
| Ambient diffraction temperature |
150 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.085 |
| Residual factor for significantly intense reflections |
0.0704 |
| Weighted residual factors for all reflections |
0.1331 |
| Weighted residual factors for significantly intense reflections |
0.1272 |
| Weighted residual factors for all reflections included in the refinement |
0.1331 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.9973 |
| Diffraction radiation wavelength |
0.6889 Å |
| Diffraction radiation type |
Synchrotron |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/1515217.html
