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Information card for entry 1515218
Preview
| Coordinates | 1515218.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C154.044 H162.374 N11.518 O2 Zn2 |
|---|---|
| Calculated formula | C154.044 H162.374 N11.518 O2 Zn2 |
| Title of publication | Engineering conjugation in para-phenylene-bridged porphyrin tapes |
| Authors of publication | Pawlicki, Miłosz; Morisue, Mitsuhiko; Davis, Nicola K. S.; McLean, Daniel G.; Haley, Joy E.; Beuerman, Erich; Drobizhev, Mikhail; Rebane, Aleksander; Thompson, Amber L.; Pascu, Sofia I.; Accorsi, Gianluca; Armaroli, Nicola; Anderson, Harry L. |
| Journal of publication | Chemical Science |
| Year of publication | 2012 |
| Journal volume | 3 |
| Journal issue | 5 |
| Pages of publication | 1541 |
| a | 10.038 ± 0.011 Å |
| b | 18.807 ± 0.018 Å |
| c | 19.38 ± 0.02 Å |
| α | 78.31 ± 0.04° |
| β | 84.46 ± 0.04° |
| γ | 82.55 ± 0.04° |
| Cell volume | 3543 ± 6 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1284 |
| Residual factor for significantly intense reflections | 0.1106 |
| Weighted residual factors for all reflections | 0.2667 |
| Weighted residual factors for significantly intense reflections | 0.2531 |
| Weighted residual factors for all reflections included in the refinement | 0.2667 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.9073 |
| Diffraction radiation wavelength | 0.6889 Å |
| Diffraction radiation type | Synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1515218.html
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Users of the data should acknowledge the original authors of the
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