Information card for entry 1515219
| Formula |
C184 H178 N10 Zn2 |
| Calculated formula |
C184 H178 N10 Zn2 |
| Title of publication |
Engineering conjugation in para-phenylene-bridged porphyrin tapes |
| Authors of publication |
Pawlicki, Miłosz; Morisue, Mitsuhiko; Davis, Nicola K. S.; McLean, Daniel G.; Haley, Joy E.; Beuerman, Erich; Drobizhev, Mikhail; Rebane, Aleksander; Thompson, Amber L.; Pascu, Sofia I.; Accorsi, Gianluca; Armaroli, Nicola; Anderson, Harry L. |
| Journal of publication |
Chemical Science |
| Year of publication |
2012 |
| Journal volume |
3 |
| Journal issue |
5 |
| Pages of publication |
1541 |
| a |
11.254 ± 0.003 Å |
| b |
16.718 ± 0.004 Å |
| c |
19.85 ± 0.004 Å |
| α |
83.634 ± 0.006° |
| β |
79.865 ± 0.004° |
| γ |
87.849 ± 0.007° |
| Cell volume |
3653.1 ± 1.5 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0937 |
| Residual factor for significantly intense reflections |
0.0769 |
| Weighted residual factors for all reflections |
0.168 |
| Weighted residual factors for significantly intense reflections |
0.1594 |
| Weighted residual factors for all reflections included in the refinement |
0.168 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.9953 |
| Diffraction radiation wavelength |
0.6889 Å |
| Diffraction radiation type |
Synchrotron |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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https://www.crystallography.net/1515219.html