Information card for entry 1515431
| Formula |
C45 H53 F3 Si2 |
| Calculated formula |
C45 H53 F3 Si2 |
| SMILES |
CCC[Si](C#Cc1c2cc3ccc(cc3cc2c(c2c1cc1ccccc1c2)C#C[Si](CCC)(CCC)CCC)C(F)(F)F)(CCC)CCC |
| Title of publication |
A survey of electron-deficient pentacenes as acceptors in polymer bulk heterojunction solar cells |
| Authors of publication |
Shu, Ying; Lim, Yee-Fun; Li, Zhong; Purushothaman, Balaji; Hallani, Rawad; Kim, Jo Eun; Parkin, Sean R.; Malliaras, George G.; Anthony, John E. |
| Journal of publication |
Chemical Science |
| Year of publication |
2011 |
| Journal volume |
2 |
| Journal issue |
2 |
| Pages of publication |
363 |
| a |
13.6256 ± 0.0004 Å |
| b |
28.5329 ± 0.0007 Å |
| c |
10.5392 ± 0.0003 Å |
| α |
90° |
| β |
101.974 ± 0.001° |
| γ |
90° |
| Cell volume |
4008.26 ± 0.19 Å3 |
| Cell temperature |
90 ± 0.2 K |
| Ambient diffraction temperature |
90 ± 0.2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1192 |
| Residual factor for significantly intense reflections |
0.0878 |
| Weighted residual factors for significantly intense reflections |
0.2056 |
| Weighted residual factors for all reflections included in the refinement |
0.2273 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.022 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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