Information card for entry 1515432
| Common name |
(Bob)Ti(O2C12H4Me4) . 0.5 C6H14 |
| Chemical name |
(2,2'-Biphenylbis(4-p-tolyl-2,4-butanedionato))- (3,3',5,5'-tetramethylbiphenyl-2,2'-diolato)titanium(IV) hemihexane solvate |
| Formula |
C53 H51 O6 Ti |
| Calculated formula |
C53 H51 O6 Ti |
| Title of publication |
Gauging electronic dissymmetry in bis-chelates of titanium(iv) using sterically and electronically variable 2,2′-biphenoxides |
| Authors of publication |
Kongprakaiwoot, Natcharee; Quiroz-Guzman, Mauricio; Oliver, Allen G.; Brown, Seth N. |
| Journal of publication |
Chemical Science |
| Year of publication |
2011 |
| Journal volume |
2 |
| Journal issue |
2 |
| Pages of publication |
331 |
| a |
9.536 ± 0.0015 Å |
| b |
10.7745 ± 0.0017 Å |
| c |
21.214 ± 0.003 Å |
| α |
87.903 ± 0.002° |
| β |
87.712 ± 0.003° |
| γ |
88.606 ± 0.002° |
| Cell volume |
2175.9 ± 0.6 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0677 |
| Residual factor for significantly intense reflections |
0.04 |
| Weighted residual factors for significantly intense reflections |
0.0927 |
| Weighted residual factors for all reflections included in the refinement |
0.1056 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.003 |
| Diffraction radiation wavelength |
0.7749 Å |
| Diffraction radiation type |
synchrotron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1515432.html