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Information card for entry 1516886
Preview
| Coordinates | 1516886.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 3 |
|---|---|
| Chemical name | 3 |
| Formula | C30 H51 O Si2 U |
| Calculated formula | C30 H51 O Si2 U |
| SMILES | [C]12(=[CH]3[CH]4=[CH]5[CH]6=[C]7([CH]8=[CH]1[U]19%10%112345678([c]2([c]%11([c]%10([c]9([c]12C)C)C(C)C)C)C)[O]1CCCC1)[Si](C)(C)C)[Si](C)(C)C |
| Title of publication | Controlling selectivity in the reductive activation of CO2by mixed sandwich uranium(iii) complexes |
| Authors of publication | Tsoureas, Nikolaos; Castro, Ludovic; Kilpatrick, Alexander F. R.; Cloke, F. Geoffey N.; Maron, Laurent |
| Journal of publication | Chemical Science |
| Year of publication | 2014 |
| Journal volume | 5 |
| Journal issue | 10 |
| Pages of publication | 3777 |
| a | 11.789 ± 0.002 Å |
| b | 18.961 ± 0.004 Å |
| c | 14.176 ± 0.003 Å |
| α | 90° |
| β | 96.89 ± 0.03° |
| γ | 90° |
| Cell volume | 3145.9 ± 1.1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0559 |
| Residual factor for significantly intense reflections | 0.0363 |
| Weighted residual factors for significantly intense reflections | 0.0732 |
| Weighted residual factors for all reflections included in the refinement | 0.0796 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1516886.html
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Users of the data should acknowledge the original authors of the
structural data.