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Information card for entry 1516887
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Coordinates | 1516887.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 4 |
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Chemical name | 4 |
Formula | C31 H53 O Si2 U |
Calculated formula | C31 H53 O Si2 U |
SMILES | [C]12(=[CH]3[CH]4=[C]5([CH]6=[CH]7[CH]8=[CH]1[U]19%10%112345678([c]2([c]1([c]9([c]%10([c]%112C)C)C)C)C(C)(C)C)[O]1CCCC1)[Si](C)(C)C)[Si](C)(C)C |
Title of publication | Controlling selectivity in the reductive activation of CO2by mixed sandwich uranium(iii) complexes |
Authors of publication | Tsoureas, Nikolaos; Castro, Ludovic; Kilpatrick, Alexander F. R.; Cloke, F. Geoffey N.; Maron, Laurent |
Journal of publication | Chemical Science |
Year of publication | 2014 |
Journal volume | 5 |
Journal issue | 10 |
Pages of publication | 3777 |
a | 12.092 ± 0.002 Å |
b | 19.621 ± 0.004 Å |
c | 13.755 ± 0.003 Å |
α | 90° |
β | 96.3 ± 0.03° |
γ | 90° |
Cell volume | 3243.8 ± 1.1 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0614 |
Residual factor for significantly intense reflections | 0.0391 |
Weighted residual factors for significantly intense reflections | 0.0753 |
Weighted residual factors for all reflections included in the refinement | 0.0823 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1516887.html
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