Information card for entry 1517759

Structure parameters

• Formula: C14 H18 N4 Se2
• Calculated formula: C14 H18 N4 Se2
• SMILES: [Se]([Se]c1nccc(c1)N(C)C)c1nccc(c1)N(C)C
• Title of publication: Synthesis and characterization of 4-(dimethylaminopyridyl)chalcogenides (Se, Te): X-ray structure of bis(4-dimethylamino-2-pyridyl) diselenide, bis(4-dimethylamino-2-pyridylselenenyl)methane and 4-dimethylamino-2,6-bis(methylselenenyl)pyridine
• Authors of publication: Jaspreet S. Dhau; Rupy Dhir; Amritpal Singh; Paula Brandao; Vitor Felix
• Journal of publication: Inorganica Chimica Acta
• Year of publication: 2013
• Journal volume: 404
• Pages of publication: 160 - 166
• a: 8.5245 ± 0.0017 Å
• b: 8.536 ± 0.0016 Å
• c: 10.7494 ± 0.0019 Å
• α: 83.933 ± 0.008°
• β: 79.358 ± 0.008°
• γ: 85.138 ± 0.008°
• Cell volume: 762.7 ± 0.2 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.052
• Residual factor for significantly intense reflections: 0.0459
• Weighted residual factors for significantly intense reflections: 0.139
• Weighted residual factors for all reflections included in the refinement: 0.1418
• Goodness-of-fit parameter for all reflections included in the refinement: 1.132
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No