Information card for entry 1517760

Structure parameters

• Formula: C15 H20 N4 Se2
• Calculated formula: C15 H20 N4 Se2
• SMILES: [Se](c1nccc(c1)N(C)C)C[Se]c1nccc(c1)N(C)C
• Title of publication: Synthesis and characterization of 4-(dimethylaminopyridyl)chalcogenides (Se, Te): X-ray structure of bis(4-dimethylamino-2-pyridyl) diselenide, bis(4-dimethylamino-2-pyridylselenenyl)methane and 4-dimethylamino-2,6-bis(methylselenenyl)pyridine
• Authors of publication: Jaspreet S. Dhau; Rupy Dhir; Amritpal Singh; Paula Brandao; Vitor Felix
• Journal of publication: Inorganica Chimica Acta
• Year of publication: 2013
• Journal volume: 404
• Pages of publication: 160 - 166
• a: 7.4142 ± 0.0003 Å
• b: 7.7316 ± 0.0003 Å
• c: 14.454 ± 0.0006 Å
• α: 81.651 ± 0.002°
• β: 81.408 ± 0.002°
• γ: 87.776 ± 0.002°
• Cell volume: 810.45 ± 0.06 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0231
• Residual factor for significantly intense reflections: 0.0194
• Weighted residual factors for significantly intense reflections: 0.0487
• Weighted residual factors for all reflections included in the refinement: 0.0505
• Goodness-of-fit parameter for all reflections included in the refinement: 1.053
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No