Information card for entry 1517779
| Formula |
C34 H20 O4 S4 |
| Calculated formula |
C34 H20 O4 S4 |
| SMILES |
C1(SC(=C(S1)c1ccc(cc1)C=O)c1ccc(cc1)C=O)=C1SC(=C(S1)c1ccc(cc1)C=O)c1ccc(cc1)C=O |
| Title of publication |
Tunable electrical conductivity in oriented thin films of tetrathiafulvalene-based covalent organic framework |
| Authors of publication |
Cai, Song-Liang; Zhang, Yue-Biao; Pun, Andrew B.; He, Bo; Yang, Jinhui; Toma, Francesca M.; Sharp, Ian D.; Yaghi, Omar M.; Fan, Jun; Zheng, Sheng-Run; Zhang, Wei-Guang; Liu, Yi |
| Journal of publication |
Chem. Sci. |
| Year of publication |
2014 |
| Journal volume |
5 |
| Journal issue |
12 |
| Pages of publication |
4693 |
| a |
9.059 ± 0.0012 Å |
| b |
11.3961 ± 0.0016 Å |
| c |
15.78 ± 0.002 Å |
| α |
68.8889 ± 0.0016° |
| β |
79.0989 ± 0.0017° |
| γ |
67.1611 ± 0.0016° |
| Cell volume |
1398.3 ± 0.3 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.064 |
| Residual factor for significantly intense reflections |
0.0554 |
| Weighted residual factors for significantly intense reflections |
0.1761 |
| Weighted residual factors for all reflections included in the refinement |
0.1875 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.071 |
| Diffraction radiation wavelength |
0.7749 Å |
| Diffraction radiation type |
synchrotron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1517779.html