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Information card for entry 1517779
Preview
Coordinates | 1517779.cif |
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Original paper (by DOI) | HTML |
Formula | C34 H20 O4 S4 |
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Calculated formula | C34 H20 O4 S4 |
SMILES | C1(SC(=C(S1)c1ccc(cc1)C=O)c1ccc(cc1)C=O)=C1SC(=C(S1)c1ccc(cc1)C=O)c1ccc(cc1)C=O |
Title of publication | Tunable electrical conductivity in oriented thin films of tetrathiafulvalene-based covalent organic framework |
Authors of publication | Cai, Song-Liang; Zhang, Yue-Biao; Pun, Andrew B.; He, Bo; Yang, Jinhui; Toma, Francesca M.; Sharp, Ian D.; Yaghi, Omar M.; Fan, Jun; Zheng, Sheng-Run; Zhang, Wei-Guang; Liu, Yi |
Journal of publication | Chem. Sci. |
Year of publication | 2014 |
Journal volume | 5 |
Journal issue | 12 |
Pages of publication | 4693 |
a | 9.059 ± 0.0012 Å |
b | 11.3961 ± 0.0016 Å |
c | 15.78 ± 0.002 Å |
α | 68.8889 ± 0.0016° |
β | 79.0989 ± 0.0017° |
γ | 67.1611 ± 0.0016° |
Cell volume | 1398.3 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.064 |
Residual factor for significantly intense reflections | 0.0554 |
Weighted residual factors for significantly intense reflections | 0.1761 |
Weighted residual factors for all reflections included in the refinement | 0.1875 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.071 |
Diffraction radiation wavelength | 0.7749 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1517779.html
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Users of the data should acknowledge the original authors of the
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