Information card for entry 1517780
| Formula |
C65 H48 N4 S4 |
| Calculated formula |
C65 H48 N4 S4 |
| SMILES |
S1C(SC(=C1c1ccc(cc1)/C=N/c1ccccc1)c1ccc(cc1)/C=N/c1ccccc1)=C1SC(=C(S1)c1ccc(/C=N/c2ccccc2)cc1)c1ccc(/C=N/c2ccccc2)cc1.c1(ccccc1)C |
| Title of publication |
Tunable electrical conductivity in oriented thin films of tetrathiafulvalene-based covalent organic framework |
| Authors of publication |
Cai, Song-Liang; Zhang, Yue-Biao; Pun, Andrew B.; He, Bo; Yang, Jinhui; Toma, Francesca M.; Sharp, Ian D.; Yaghi, Omar M.; Fan, Jun; Zheng, Sheng-Run; Zhang, Wei-Guang; Liu, Yi |
| Journal of publication |
Chem. Sci. |
| Year of publication |
2014 |
| Journal volume |
5 |
| Journal issue |
12 |
| Pages of publication |
4693 |
| a |
15.9142 ± 0.0007 Å |
| b |
7.9235 ± 0.0004 Å |
| c |
20.8037 ± 0.001 Å |
| α |
90° |
| β |
106.326 ± 0.003° |
| γ |
90° |
| Cell volume |
2517.5 ± 0.2 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.078 |
| Residual factor for significantly intense reflections |
0.0557 |
| Weighted residual factors for significantly intense reflections |
0.1379 |
| Weighted residual factors for all reflections included in the refinement |
0.1511 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.017 |
| Diffraction radiation wavelength |
0.7749 Å |
| Diffraction radiation type |
synchrotron |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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