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Information card for entry 1529205
Preview
Coordinates | 1529205.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [U(NCO)L3] |
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Formula | C40 H69 N7 O Si6 U |
Calculated formula | C40 H69 N7 O Si6 U |
SMILES | C(=N[U]123(N(C(=[N]1[Si](C)(C)C)c1ccccc1)[Si](C)(C)C)([N]([Si](C)(C)C)=C(N2[Si](C)(C)C)c1ccccc1)[N](=C(N3[Si](C)(C)C)c1ccccc1)[Si](C)(C)C)=O |
Title of publication | Uranium and thorium complexes of the phosphaethynolate ion |
Authors of publication | Camp, Clément; Settineri, Nicholas; Lefèvre, Julia; Jupp, Andrew R.; Goicoechea, José M.; Maron, Laurent; Arnold, John |
Journal of publication | Chem. Sci. |
Year of publication | 2015 |
Journal volume | 6 |
Journal issue | 11 |
Pages of publication | 6379 |
a | 15.5201 ± 0.0007 Å |
b | 17.9868 ± 0.0008 Å |
c | 37.3806 ± 0.0017 Å |
α | 90° |
β | 97.783 ± 0.002° |
γ | 90° |
Cell volume | 10338.9 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0314 |
Residual factor for significantly intense reflections | 0.0285 |
Weighted residual factors for significantly intense reflections | 0.0539 |
Weighted residual factors for all reflections included in the refinement | 0.0545 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.319 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1529205.html
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