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Information card for entry 1529206
Preview
Coordinates | 1529206.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C43.5 H73 N7 O Si6 Th |
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Calculated formula | C43.5 H73 N7 O Si6 Th |
SMILES | C(=N[Th]123([N]([Si](C)(C)C)=C(c4ccccc4)N1[Si](C)(C)C)([N]([Si](C)(C)C)=C(c1ccccc1)N2[Si](C)(C)C)[N]([Si](C)(C)C)=C(c1ccccc1)N3[Si](C)(C)C)=O |
Title of publication | Uranium and thorium complexes of the phosphaethynolate ion |
Authors of publication | Camp, Clément; Settineri, Nicholas; Lefèvre, Julia; Jupp, Andrew R.; Goicoechea, José M.; Maron, Laurent; Arnold, John |
Journal of publication | Chem. Sci. |
Year of publication | 2015 |
Journal volume | 6 |
Journal issue | 11 |
Pages of publication | 6379 |
a | 11.2966 ± 0.0019 Å |
b | 23.057 ± 0.004 Å |
c | 23.27 ± 0.004 Å |
α | 66.405 ± 0.006° |
β | 87.39 ± 0.006° |
γ | 77.614 ± 0.006° |
Cell volume | 5419.5 ± 1.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0226 |
Residual factor for significantly intense reflections | 0.0195 |
Weighted residual factors for significantly intense reflections | 0.0469 |
Weighted residual factors for all reflections included in the refinement | 0.0482 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1529206.html
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Users of the data should acknowledge the original authors of the
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