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Information card for entry 1529208
Preview
Coordinates | 1529208.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Th(NCS)(amid)3 |
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Formula | C43.5 H73 N7 S Si6 Th |
Calculated formula | C43.5 H73 N7 S Si6 Th |
SMILES | [Th]123(N([Si](C)(C)C)C(=[N]1[Si](C)(C)C)c1ccccc1)(N([Si](C)(C)C)C(=[N]2[Si](C)(C)C)c1ccccc1)(N([Si](C)(C)C)C(=[N]3[Si](C)(C)C)c1ccccc1)N=C=S.c1ccc(C)cc1 |
Title of publication | Uranium and thorium complexes of the phosphaethynolate ion |
Authors of publication | Camp, Clément; Settineri, Nicholas; Lefèvre, Julia; Jupp, Andrew R.; Goicoechea, José M.; Maron, Laurent; Arnold, John |
Journal of publication | Chem. Sci. |
Year of publication | 2015 |
Journal volume | 6 |
Journal issue | 11 |
Pages of publication | 6379 |
a | 11.6047 ± 0.0006 Å |
b | 11.6602 ± 0.0006 Å |
c | 21.204 ± 0.0011 Å |
α | 86.479 ± 0.002° |
β | 83.836 ± 0.002° |
γ | 75.464 ± 0.002° |
Cell volume | 2759.5 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0282 |
Residual factor for significantly intense reflections | 0.0278 |
Weighted residual factors for significantly intense reflections | 0.0779 |
Weighted residual factors for all reflections included in the refinement | 0.0781 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.417 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1529208.html
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