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Information card for entry 1529207
Preview
Coordinates | 1529207.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | U(NCS)(amid)3.toluene |
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Formula | C43.5 H73 N7 S Si6 U |
Calculated formula | C43.5 H73 N7 S Si6 U |
SMILES | [U]123(N([Si](C)(C)C)C(=[N]1[Si](C)(C)C)c1ccccc1)(N=C=S)(N([Si](C)(C)C)C(=[N]2[Si](C)(C)C)c1ccccc1)N([Si](C)(C)C)C(=[N]3[Si](C)(C)C)c1ccccc1.Cc1ccccc1 |
Title of publication | Uranium and thorium complexes of the phosphaethynolate ion |
Authors of publication | Camp, Clément; Settineri, Nicholas; Lefèvre, Julia; Jupp, Andrew R.; Goicoechea, José M.; Maron, Laurent; Arnold, John |
Journal of publication | Chem. Sci. |
Year of publication | 2015 |
Journal volume | 6 |
Journal issue | 11 |
Pages of publication | 6379 |
a | 11.581 ± 0.0007 Å |
b | 11.6278 ± 0.0007 Å |
c | 21.115 ± 0.0013 Å |
α | 86.775 ± 0.002° |
β | 83.982 ± 0.002° |
γ | 75.259 ± 0.002° |
Cell volume | 2733.3 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.03 |
Residual factor for significantly intense reflections | 0.0294 |
Weighted residual factors for significantly intense reflections | 0.0794 |
Weighted residual factors for all reflections included in the refinement | 0.0796 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.383 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1529207.html
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