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Information card for entry 1529330
Preview
Coordinates | 1529330.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C27 H22 F9 N6 O9 P S3 |
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Calculated formula | C27 H22 F9 N6 O9 P S3 |
SMILES | S(=O)(=O)([O-])C(F)(F)F.S(=O)(=O)([O-])C(F)(F)F.S(=O)(=O)([O-])C(F)(F)F.[P]12([n]3ccccc3c3[n]1cccc3)[n]1ccccc1c1[n]2cccc1.N#CC.N#CC |
Title of publication | Bipyridine complexes of E3+(E = P, As, Sb, Bi): strong Lewis acids, sources of E(OTf)3and synthons for EIand EVcations |
Authors of publication | Chitnis, Saurabh S.; Robertson, Alasdair P. M.; Burford, Neil; Patrick, Brian O.; McDonald, Robert; Ferguson, Michael J. |
Journal of publication | Chem. Sci. |
Year of publication | 2015 |
Journal volume | 6 |
Journal issue | 11 |
Pages of publication | 6545 |
a | 28.5371 ± 0.0009 Å |
b | 13.8414 ± 0.0005 Å |
c | 21.8775 ± 0.0007 Å |
α | 90° |
β | 124.553 ± 0.0013° |
γ | 90° |
Cell volume | 7117.1 ± 0.4 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296.15 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0671 |
Residual factor for significantly intense reflections | 0.0491 |
Weighted residual factors for significantly intense reflections | 0.109 |
Weighted residual factors for all reflections included in the refinement | 0.1157 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.13 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1529330.html
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Users of the data should acknowledge the original authors of the
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