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Information card for entry 1529329
Preview
Coordinates | 1529329.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H36 As F9 N8 O9 S3 |
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Calculated formula | C28 H36 As F9 N8 O9 S3 |
SMILES | [As]([n]1ccc(N(C)C)cc1)([n]1ccc(N(C)C)cc1)[n]1ccc(N(C)C)cc1.S(=O)(=O)([O-])C(F)(F)F.S(=O)(=O)([O-])C(F)(F)F.S(=O)(=O)([O-])C(F)(F)F.N#CC.N#CC |
Title of publication | Bipyridine complexes of E3+(E = P, As, Sb, Bi): strong Lewis acids, sources of E(OTf)3and synthons for EIand EVcations |
Authors of publication | Chitnis, Saurabh S.; Robertson, Alasdair P. M.; Burford, Neil; Patrick, Brian O.; McDonald, Robert; Ferguson, Michael J. |
Journal of publication | Chem. Sci. |
Year of publication | 2015 |
Journal volume | 6 |
Journal issue | 11 |
Pages of publication | 6545 |
a | 12.3457 ± 0.0011 Å |
b | 13.3802 ± 0.0012 Å |
c | 14.5721 ± 0.0013 Å |
α | 81.4461 ± 0.0011° |
β | 66.6056 ± 0.001° |
γ | 72.0828 ± 0.0011° |
Cell volume | 2101.1 ± 0.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0446 |
Residual factor for significantly intense reflections | 0.0364 |
Weighted residual factors for significantly intense reflections | 0.096 |
Weighted residual factors for all reflections included in the refinement | 0.1008 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1529329.html
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Users of the data should acknowledge the original authors of the
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