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Information card for entry 1546875
Preview
Coordinates | 1546875.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C31 H24 Eu F15 N2 Ni O12 |
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Calculated formula | C31 H24 Eu F15 N2 Ni O12 |
SMILES | [Eu]123456([O]=C(C(F)(F)F)C=C(O5)C(F)(F)F)([O]5[Ni]78([O]2c2c([O]1C)cccc2C=[N]8CC(O)C[N]7=Cc1cccc([O]3C)c51)([OH2])[O]=C(O4)C(F)(F)F)[O]=C(C(F)(F)F)C=C(O6)C(F)(F)F |
Title of publication | Three series of heterometallic Ni <sup>II</sup> –Ln <sup>III</sup> Schiff base complexes: synthesis, crystal structures and magnetic characterization |
Authors of publication | Jiang, Lin; Liu, Yue; Liu, Xin; Tian, Jinlei; Yan, Shiping |
Journal of publication | Dalton Transactions |
Year of publication | 2017 |
Journal volume | 46 |
Journal issue | 37 |
Pages of publication | 12558 - 12573 |
a | 18.242 ± 0.002 Å |
b | 12.6901 ± 0.0014 Å |
c | 16.631 ± 0.0019 Å |
α | 90° |
β | 97.744 ± 0.002° |
γ | 90° |
Cell volume | 3814.8 ± 0.7 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0786 |
Residual factor for significantly intense reflections | 0.0727 |
Weighted residual factors for significantly intense reflections | 0.2775 |
Weighted residual factors for all reflections included in the refinement | 0.2836 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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