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Information card for entry 1546876
Preview
Coordinates | 1546876.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H57 Cl4 Eu N2 Ni O11 |
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Calculated formula | C66 H57 Cl4 Eu N2 Ni O11 |
SMILES | [Eu]123456([O]7c8c([O]6C)cccc8C=[N]6CC(O)C[N]8=Cc9c([O]2[Ni]2768[O]5C(c5ccccc5)=CC(=[O]2)c2ccccc2)c([O]1C)ccc9)(OC(=CC(=[O]3)c1ccccc1)c1ccccc1)OC(=CC(=[O]4)c1ccccc1)c1ccccc1.ClCCl.ClCCl |
Title of publication | Three series of heterometallic Ni <sup>II</sup> –Ln <sup>III</sup> Schiff base complexes: synthesis, crystal structures and magnetic characterization |
Authors of publication | Jiang, Lin; Liu, Yue; Liu, Xin; Tian, Jinlei; Yan, Shiping |
Journal of publication | Dalton Transactions |
Year of publication | 2017 |
Journal volume | 46 |
Journal issue | 37 |
Pages of publication | 12558 - 12573 |
a | 11.2622 ± 0.0008 Å |
b | 12.6894 ± 0.0011 Å |
c | 23.49 ± 0.002 Å |
α | 81.784 ± 0.004° |
β | 83.709 ± 0.004° |
γ | 76.878 ± 0.004° |
Cell volume | 3225.4 ± 0.5 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0654 |
Residual factor for significantly intense reflections | 0.062 |
Weighted residual factors for significantly intense reflections | 0.1858 |
Weighted residual factors for all reflections included in the refinement | 0.1878 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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