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Information card for entry 1548094
Preview
Coordinates | 1548094.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H99 Cs N5 O6 Si3 U |
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Calculated formula | C45 H99 Cs N5 O6 Si3 U |
SMILES | [U]123(N([Si](C(C)C)(C(C)C)C(C)C)CC[N]3(CCN1[Si](C(C)C)(C(C)C)C(C)C)CCN2[Si](C(C)C)(C(C)C)C(C)C)=N[Cs]12345[O]6CC[O]1CC[O]2CC[O]3CC[O]4CC[O]5CC6 |
Title of publication | Molecular and electronic structure of terminal and alkali metal-capped uranium(V) nitride complexes |
Authors of publication | David M. King; Peter A. Cleaves; Ashley J. Wooles; Benedict M. Gardner; Nicholas F. Chilton; Floriana Tuna; William Lewis; Eric J. L. McInnes; Stephen T. Liddle |
Journal of publication | Nature Communications |
Year of publication | 2016 |
Journal volume | 7 |
Pages of publication | 13773 |
a | 14.5874 ± 0.0004 Å |
b | 13.7318 ± 0.0003 Å |
c | 28.4495 ± 0.0008 Å |
α | 90° |
β | 91.52 ± 0.003° |
γ | 90° |
Cell volume | 5696.7 ± 0.3 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0535 |
Residual factor for significantly intense reflections | 0.0457 |
Weighted residual factors for significantly intense reflections | 0.1204 |
Weighted residual factors for all reflections included in the refinement | 0.1285 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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