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Information card for entry 1548095
Preview
Coordinates | 1548095.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C53 H99 K N5 O6 Si3 U |
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Calculated formula | C53 H99 K N5 O6 Si3 U |
SMILES | [U]123(N([Si](C(C)C)(C(C)C)C(C)C)CC[N]3(CCN1[Si](C(C)C)(C(C)C)C(C)C)CCN2[Si](C(C)C)(C(C)C)C(C)C)=N[K]12345[O]6CC[O]1CC[O]2c1ccccc1[O]3CC[O]4CC[O]5c1ccccc61 |
Title of publication | Molecular and electronic structure of terminal and alkali metal-capped uranium(V) nitride complexes |
Authors of publication | David M. King; Peter A. Cleaves; Ashley J. Wooles; Benedict M. Gardner; Nicholas F. Chilton; Floriana Tuna; William Lewis; Eric J. L. McInnes; Stephen T. Liddle |
Journal of publication | Nature Communications |
Year of publication | 2016 |
Journal volume | 7 |
Pages of publication | 13773 |
a | 11.83314 ± 0.0001 Å |
b | 22.09845 ± 0.00018 Å |
c | 22.8903 ± 0.00019 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5985.68 ± 0.09 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.016 |
Residual factor for significantly intense reflections | 0.0158 |
Weighted residual factors for significantly intense reflections | 0.0373 |
Weighted residual factors for all reflections included in the refinement | 0.0374 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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