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Information card for entry 1549245
Preview
Coordinates | 1549245.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C33 H42 Cu F6 N2 Sb |
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Calculated formula | C33 H42 Cu F6 N2 Sb |
SMILES | [Sb](F)(F)([F-])(F)(F)F.[Cu]1(=C2N(c3c(cccc3C(C)C)C(C)C)C=CN2c2c(C(C)C)cccc2C(C)C)[CH]2C=CC=C[CH]1=2 |
Title of publication | Taming a monomeric [Cu(η<sup>6</sup>-C<sub>6</sub>H<sub>6</sub>)]<sup>+</sup> complex with silylene. |
Authors of publication | Parvin, Nasrina; Pal, Shiv; Echeverría, Jorge; Alvarez, Santiago; Khan, Shabana |
Journal of publication | Chemical science |
Year of publication | 2018 |
Journal volume | 9 |
Journal issue | 18 |
Pages of publication | 4333 - 4337 |
a | 13.3555 ± 0.0016 Å |
b | 13.9173 ± 0.0016 Å |
c | 18.181 ± 0.002 Å |
α | 90° |
β | 102.245 ± 0.003° |
γ | 90° |
Cell volume | 3302.5 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0958 |
Residual factor for significantly intense reflections | 0.0516 |
Weighted residual factors for significantly intense reflections | 0.0932 |
Weighted residual factors for all reflections included in the refinement | 0.1086 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1549245.html
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