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Information card for entry 1549246
Preview
Coordinates | 1549246.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H56 Cl2 Cu F6 N2 Sb |
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Calculated formula | C40 H56 Cl2 Cu F6 N2 Sb |
SMILES | [Sb](F)(F)(F)(F)([F-])F.[Cu]12(=C3N(c4c(C(C)C)cccc4C(C)C)C=CN3c3c(cccc3C(C)C)C(C)C)[C]3(=[C]1(C(=C(C(=[C]23C)C)C)C)C)C.ClCCl |
Title of publication | Taming a monomeric [Cu(η<sup>6</sup>-C<sub>6</sub>H<sub>6</sub>)]<sup>+</sup> complex with silylene. |
Authors of publication | Parvin, Nasrina; Pal, Shiv; Echeverría, Jorge; Alvarez, Santiago; Khan, Shabana |
Journal of publication | Chemical science |
Year of publication | 2018 |
Journal volume | 9 |
Journal issue | 18 |
Pages of publication | 4333 - 4337 |
a | 10.506 ± 0.005 Å |
b | 20.813 ± 0.009 Å |
c | 20.435 ± 0.009 Å |
α | 90° |
β | 104.638 ± 0.01° |
γ | 90° |
Cell volume | 4323 ± 3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.125 |
Residual factor for significantly intense reflections | 0.0632 |
Weighted residual factors for significantly intense reflections | 0.1003 |
Weighted residual factors for all reflections included in the refinement | 0.1066 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.971 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1549246.html
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