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Information card for entry 1552315
Preview
| Coordinates | 1552315.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 1,1?,2,2?-Bis(tetraisopropyldisiloxa)nickelocene |
|---|---|
| Formula | C34 H62 Ni O2 Si4 |
| Calculated formula | C34 H62 Ni O2 Si4 |
| SMILES | [Ni]12345678([c]9%10[cH]1[cH]3[cH]5[c]79[Si](O[Si]%10(C(C)C)C(C)C)(C(C)C)C(C)C)[c]13[cH]2[cH]4[cH]6[c]81[Si](O[Si]3(C(C)C)C(C)C)(C(C)C)C(C)C |
| Title of publication | Role of torsional strain in the ring-opening polymerisation of low strain [n]nickelocenophanes |
| Authors of publication | Musgrave, Rebecca A.; Hailes, Rebekah L. N.; Annibale, Vincent T.; Manners, Ian |
| Journal of publication | Chemical Science |
| Year of publication | 2019 |
| a | 10.1921 ± 0.0017 Å |
| b | 10.2027 ± 0.0014 Å |
| c | 10.3527 ± 0.0016 Å |
| α | 83.268 ± 0.01° |
| β | 83.418 ± 0.012° |
| γ | 62.359 ± 0.01° |
| Cell volume | 944.9 ± 0.3 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0983 |
| Residual factor for significantly intense reflections | 0.0825 |
| Weighted residual factors for significantly intense reflections | 0.2284 |
| Weighted residual factors for all reflections included in the refinement | 0.2546 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1552315.html
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Users of the data should acknowledge the original authors of the
structural data.