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Information card for entry 1553617
Preview
Coordinates | 1553617.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H72 Li4 O4 S4 Si4 |
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Calculated formula | C44 H72 Li4 O4 S4 Si4 |
SMILES | s1[c]234c(cc1[Si](C)(C)C)c1[c]56(sc(c1)[Si](C)(C)C)[Li]1([O]7CCCC7)[c]78(c(cc(s8)[Si](C)(C)C)c8[c]1([Li]27[O]1CCCC1)(sc(c8)[Si](C)(C)C)[Li]46[O]1CCCC1)[Li]35[O]1CCCC1 |
Title of publication | Selective deprotonation of tetra[3,4]thienylene in the presence of n-BuLi |
Authors of publication | Li, Lu; Li, Bingbing; Li, Chunli; Ma, Zhiying; Xu, Li; Wang, Hua |
Journal of publication | Organic Chemistry Frontiers |
Year of publication | 2017 |
Journal volume | 4 |
Journal issue | 6 |
Pages of publication | 1019 |
a | 20.763 ± 0.003 Å |
b | 20.763 ± 0.003 Å |
c | 13.7545 ± 0.0018 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5929.6 ± 1.4 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296.15 K |
Number of distinct elements | 6 |
Space group number | 88 |
Hermann-Mauguin space group symbol | I 41/a :2 |
Hall space group symbol | -I 4ad |
Residual factor for all reflections | 0.1222 |
Residual factor for significantly intense reflections | 0.0831 |
Weighted residual factors for significantly intense reflections | 0.2424 |
Weighted residual factors for all reflections included in the refinement | 0.2973 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1553617.html
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