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Information card for entry 1569650
Preview
Coordinates | 1569650.cif |
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Original paper (by DOI) | HTML |
Formula | C176 H208 Al Bi8 O22 |
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Calculated formula | C176 H208 Al Bi8 O22 |
Title of publication | Electron delocalization of robust high-nuclear bismuth-oxo clusters for promoted CO<sub>2</sub> electroreduction. |
Authors of publication | Hou, Baoshan; Zheng, Haiyan; Zhang, Kunhao; Wu, Qi; Qin, Chao; Sun, Chunyi; Pan, Qinhe; Kang, Zhenhui; Wang, Xinlong; Su, Zhongmin |
Journal of publication | Chemical science |
Year of publication | 2023 |
Journal volume | 14 |
Journal issue | 33 |
Pages of publication | 8962 - 8969 |
a | 22.561 ± 0.0004 Å |
b | 22.561 ± 0.0004 Å |
c | 80.946 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 41201 ± 2 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173.02 K |
Number of distinct elements | 5 |
Space group number | 88 |
Hermann-Mauguin space group symbol | I 41/a :2 |
Hall space group symbol | -I 4ad |
Residual factor for all reflections | 0.101 |
Residual factor for significantly intense reflections | 0.0544 |
Weighted residual factors for significantly intense reflections | 0.1166 |
Weighted residual factors for all reflections included in the refinement | 0.1343 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Diffraction radiation X-ray symbol | K-L~3~ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1569650.html
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Users of the data should acknowledge the original authors of the
structural data.