Information card for entry 1574074

Structure parameters

• Formula: C32 H56 Al2 B10 I3 N4 Si2
• Calculated formula: C32 H56 Al2 B10 I3 N4 Si2
• SMILES: I[Al](I)(I)[Al]1[Si]2([N](=C(N2C(C)(C)C)c2ccccc2)C(C)(C)C)[C]2345[C]678([Si]91[N](=C(N9C(C)(C)C)c1ccccc1)C(C)(C)C)[BH]193[BH]3%10%11[BH]%12%13%14[BH]%15%163[BH]32([BH]2%12%15[BH]6%13([BH]4732)[BH]89%11%14)[BH]51%10%16
• Title of publication: Redox non-innocent bis-silylene aluminium complexes with a carborane backbone
• Authors of publication: Saddington, Artemis; Yao, Shenglai; Lorent, Christian; Driess, Matthias
• Journal of publication: Chemical Science
• Year of publication: 2025
• Journal volume: 16
• Journal issue: 15
• Pages of publication: 6383 - 6391
• a: 12.2257 ± 0.0003 Å
• b: 13.2295 ± 0.0004 Å
• c: 17.0355 ± 0.0007 Å
• α: 109.939 ± 0.003°
• β: 102.833 ± 0.003°
• γ: 100.765 ± 0.003°
• Cell volume: 2419.65 ± 0.16 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0572
• Residual factor for significantly intense reflections: 0.0482
• Weighted residual factors for significantly intense reflections: 0.125
• Weighted residual factors for all reflections included in the refinement: 0.1349
• Goodness-of-fit parameter for all reflections included in the refinement: 1.044
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No