Information card for entry 1574075

Structure parameters

• Formula: C46 H72 Al B10 I2 N4 Si2
• Calculated formula: C46 H72 Al B10 I2 N4 Si2
• SMILES: I[Al]1(I)[Si]2([N](=C(N2C(C)(C)C)c2ccccc2)C(C)(C)C)[C]234[BH]567[C]89([Si]%101[N](=C(N%10C(C)(C)C)c1ccccc1)C(C)(C)C)[BH]1%104[BH]4%113[BH]325[BH]257[BH]769[BH]681[BH]1%10%11[BH]432[BH]5761.Cc1ccccc1.Cc1ccccc1
• Title of publication: Redox non-innocent bis-silylene aluminium complexes with a carborane backbone
• Authors of publication: Saddington, Artemis; Yao, Shenglai; Lorent, Christian; Driess, Matthias
• Journal of publication: Chemical Science
• Year of publication: 2025
• Journal volume: 16
• Journal issue: 15
• Pages of publication: 6383 - 6391
• a: 14.6482 ± 0.0007 Å
• b: 14.829 ± 0.0007 Å
• c: 18.4781 ± 0.001 Å
• α: 105.669 ± 0.004°
• β: 106.625 ± 0.005°
• γ: 100.731 ± 0.004°
• Cell volume: 3548.9 ± 0.4 ų
• Cell temperature: 150.2 ± 0.4 K
• Ambient diffraction temperature: 150.15 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0753
• Residual factor for significantly intense reflections: 0.0534
• Weighted residual factors for significantly intense reflections: 0.1353
• Weighted residual factors for all reflections included in the refinement: 0.1537
• Goodness-of-fit parameter for all reflections included in the refinement: 0.975
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No