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Information card for entry 1574646
Preview
| Coordinates | 1574646.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C92 H112 In4 O78 Ti12 |
|---|---|
| Calculated formula | C92 H112 In4 O78 Ti12 |
| SMILES | c1c2C3=[O][In]4567([OH2])([OH2])[O]3[Ti]389(Oc2ccc1)O[Ti]12%10%11[O]%12[Ti]%13%14%15([O]1C)[O](C)[Ti]1%16%12(Oc%12c(cccc%12)C%12=[O][In]%17%18([OH2])([O]=C(c%19ccccc%19O2)[O]%11%17)([O]%13C(c2ccccc2O%14)=[O]%18)([OH2])[O]%16%12)O[Ti]2%11%12%13[O]%14[Ti]%16%17%18(O[Ti]%19%20(O1)(Oc1c(cccc1)C(=[O]4)[O]7%20)[O]3[Ti]1(O%15)([O]%19C)([O]8C)Oc3c(C([O]51)=[O]6)cccc3)[O](C)[Ti]1%14([O]2C)(Oc2c(cccc2)C2[O]1[In]13([OH2])([OH2])([O]=2)([O]=C(c2ccccc2O%16)[O]3%18)[O]=C(c2ccccc2O%11)[O]1%13)O[Ti]1234[O]5[Ti]6([O]7C)(O%10)(O%12)Oc8c(cccc8)C8=[O][In]7%10([OH2])([OH2])([O]68)([O]1C(c1ccccc1O4)=[O]3)[O]=C1c3ccccc3O[Ti]5([O]2C)(O9)(O%17)[O]1%10.O.O.O.O.O.O.O.O.O.O.O.O |
| Title of publication | Ligand effect on In-Ti-oxo nanoclusters for nanolithography. |
| Authors of publication | Wu, Jiao; Chen, Jiali; Wang, Liming; Ye, Yuting; Zhan, Xiaozhi; Song, Yihang; Li, Qiao-Hong; Yi, Xiaofeng; Zhang, Jian |
| Journal of publication | Materials horizons |
| Year of publication | 2025 |
| Journal volume | 12 |
| Journal issue | 16 |
| Pages of publication | 6283 - 6290 |
| a | 19.6806 ± 0.0004 Å |
| b | 19.6806 ± 0.0004 Å |
| c | 15.9007 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6158.8 ± 0.2 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 114 |
| Hermann-Mauguin space group symbol | P -4 21 c |
| Hall space group symbol | P -4 2n |
| Residual factor for all reflections | 0.1069 |
| Residual factor for significantly intense reflections | 0.0797 |
| Weighted residual factors for significantly intense reflections | 0.1991 |
| Weighted residual factors for all reflections included in the refinement | 0.2157 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.3405 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1574646.html
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