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Information card for entry 1574647
Preview
| Coordinates | 1574647.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C92 H68 In4 N12 O88 Ti12 |
|---|---|
| Calculated formula | C92 H68 In4 N12 O88 Ti12 |
| SMILES | [In]123456([O]7[Ti]89%10(Oc%11ccc(N(=O)=O)cc%11C7=[O]2)O[Ti]27%11%12Oc%13ccc(N(=O)=O)cc%13C%13=[O][In]%14%15([O]=C%16O[Ti]%17%18([O]7C)([O](C)[Ti]7%19(Oc%20c(C(=[O]%14)[O]%157)cc(N(=O)=O)cc%20)(O[Ti]7%14%15%20[O]%21[Ti]%22%23([O]([Ti]%24%25%21([O]%21C(=[O][In]%26%27%21([O]=C([O]%23%26)c%21cc(N(=O)=O)ccc%21O%22)([O]%15C(=[O]%27)c%15cc(N(=O)=O)ccc%15O%14)(O[In]%14%15%21%22([O]=C%23[O]%14[Ti]%14(Oc%26c%23cc(N(=O)=O)cc%26)(O8)([O]8[Ti]%23%26(Oc%27ccc(N(=O)=O)cc%27C(=[O]%22)[O]%21%23)([O]([Ti]%218([O]=C(O%15)c8c(O%21)ccc(N(=O)=O)c8)([O]%14C)O[Ti]8%14([O]([Ti]%15([O]3C(=[O]4)c3c(O%15)ccc(N(=O)=O)c3)(O%26)([O]98)O%19)C)(Oc3c(cc(N(=O)=O)cc3)C(=[O]5)[O]6%14)[O]%10C)C)O%20)O%25)[OH2])[OH2])c3c(O%24)ccc(N(=O)=O)c3)O%11)C)(O%17)[O]7C)[O]%12%18)Oc3c%16cc(N(=O)=O)cc3)([O]2%13)(O1)[OH2])[OH2] |
| Title of publication | Ligand effect on In-Ti-oxo nanoclusters for nanolithography. |
| Authors of publication | Wu, Jiao; Chen, Jiali; Wang, Liming; Ye, Yuting; Zhan, Xiaozhi; Song, Yihang; Li, Qiao-Hong; Yi, Xiaofeng; Zhang, Jian |
| Journal of publication | Materials horizons |
| Year of publication | 2025 |
| Journal volume | 12 |
| Journal issue | 16 |
| Pages of publication | 6283 - 6290 |
| a | 18.855 ± 0.0004 Å |
| b | 16.9266 ± 0.0002 Å |
| c | 31.0947 ± 0.0005 Å |
| α | 90° |
| β | 103.552 ± 0.002° |
| γ | 90° |
| Cell volume | 9647.6 ± 0.3 Å3 |
| Cell temperature | 120 ± 0.3 K |
| Ambient diffraction temperature | 120 ± 0.3 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0819 |
| Residual factor for significantly intense reflections | 0.0672 |
| Weighted residual factors for significantly intense reflections | 0.192 |
| Weighted residual factors for all reflections included in the refinement | 0.2029 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.3405 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1574647.html
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Users of the data should acknowledge the original authors of the
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