Information card for entry 2004612
| Formula |
C14 H12 O3 S |
| Calculated formula |
C14 H12 O3 S |
| SMILES |
S1(=O)O[C@H]([C@@H](O1)c1ccccc1)c1ccccc1 |
| Title of publication |
<i>cis</i>,<i>trans</i>-4,5-Diphenyl-1,3,2-dioxathiolane 2-Oxide, <i>cis</i>,<i>cis</i>-4,5-Diphenyl-1,3,2-dioxathiolane 2-Oxide and 4,4-Diphenyl-1,3,2-dioxathiolane 2-Oxide |
| Authors of publication |
Hellier, D. G.; Motevalli, M. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1996 |
| Journal volume |
52 |
| Journal issue |
3 |
| Pages of publication |
739 - 743 |
| a |
5.809 ± 0.001 Å |
| b |
15.514 ± 0.003 Å |
| c |
13.883 ± 0.002 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1251.1 ± 0.4 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
19 |
| Hermann-Mauguin space group symbol |
P 21 21 21 |
| Hall space group symbol |
P 2ac 2ab |
| Residual factor for all reflections |
0.073 |
| Residual factor for significantly intense reflections |
0.0286 |
| Weighted residual factors for all reflections |
0.082 |
| Weighted residual factors for significantly intense reflections |
0.0719 |
| Goodness-of-fit parameter for all reflections |
0.921 |
| Goodness-of-fit parameter for significantly intense reflections |
1.075 |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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