Information card for entry 2004613
| Formula |
C14 H12 O3 S |
| Calculated formula |
C14 H12 O3 S |
| SMILES |
S1(=O)O[C@H]([C@H](O1)c1ccccc1)c1ccccc1 |
| Title of publication |
<i>cis</i>,<i>trans</i>-4,5-Diphenyl-1,3,2-dioxathiolane 2-Oxide, <i>cis</i>,<i>cis</i>-4,5-Diphenyl-1,3,2-dioxathiolane 2-Oxide and 4,4-Diphenyl-1,3,2-dioxathiolane 2-Oxide |
| Authors of publication |
Hellier, D. G.; Motevalli, M. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1996 |
| Journal volume |
52 |
| Journal issue |
3 |
| Pages of publication |
739 - 743 |
| a |
6.456 ± 0.001 Å |
| b |
7.808 ± 0.001 Å |
| c |
12.636 ± 0.002 Å |
| α |
93.86 ± 0.01° |
| β |
98.97 ± 0.01° |
| γ |
98.81 ± 0.01° |
| Cell volume |
619.03 ± 0.16 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.1945 |
| Residual factor for significantly intense reflections |
0.0633 |
| Weighted residual factors for all reflections |
0.1767 |
| Weighted residual factors for significantly intense reflections |
0.143 |
| Goodness-of-fit parameter for all reflections |
0.862 |
| Goodness-of-fit parameter for significantly intense reflections |
1.197 |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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