Information card for entry 2005344
| Chemical name |
rel-(1S, 4R, 7R, 9S)-tetracyclo[5.4.1.0^4,12^.0^9,12^]dodec-10- enylacetic acid |
| Formula |
C14 H18 O2 |
| Calculated formula |
C14 H18 O2 |
| SMILES |
O=C(O)C[C@@]12CC[C@H]3CC[C@@H]4C[C@@H](C=C1)[C@]234.O=C(O)C[C@]12CC[C@@H]3CC[C@H]4C[C@H](C=C1)[C@@]234 |
| Title of publication |
A Substituted <i>cis</i>,<i>trans</i>,<i>cis</i>,<i>cis</i>-[4.5.5.5]Fenestrene |
| Authors of publication |
Wang, J.; Thommen, M.; Keese, R. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1996 |
| Journal volume |
52 |
| Journal issue |
9 |
| Pages of publication |
2311 - 2313 |
| a |
5.618 ± 0.004 Å |
| b |
7.995 ± 0.004 Å |
| c |
13.428 ± 0.006 Å |
| α |
77.85 ± 0.04° |
| β |
85.55 ± 0.06° |
| γ |
80.46 ± 0.04° |
| Cell volume |
580.9 ± 0.6 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0639 |
| Residual factor for significantly intense reflections |
0.0419 |
| Weighted residual factors for all reflections |
0.1181 |
| Weighted residual factors for significantly intense reflections |
0.1029 |
| Goodness-of-fit parameter for all reflections |
1.029 |
| Goodness-of-fit parameter for significantly intense reflections |
1.092 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/2005344.html