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Information card for entry 2005552
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| Coordinates | 2005552.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | diethylgallium |
|---|---|
| Formula | C44 H46 Ga2 O2 |
| Calculated formula | C44 H46 Ga2 O2 |
| SMILES | [Ga]1([O]([Ga]([O]1c1c(cccc1c1ccccc1)c1ccccc1)(CC)CC)c1c(cccc1c1ccccc1)c1ccccc1)(CC)CC |
| Title of publication | Bis[(μ-2,6-diphenylphenoxido-<i>O</i>:<i>O</i>)diethylgallium] |
| Authors of publication | Webster, M.; Browning, D. J.; Corker, J. M. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 10 |
| Pages of publication | 2439 - 2441 |
| a | 11.852 ± 0.004 Å |
| b | 15.559 ± 0.003 Å |
| c | 11.254 ± 0.004 Å |
| α | 98.3 ± 0.02° |
| β | 115.7 ± 0.03° |
| γ | 89.4 ± 0.02° |
| Cell volume | 1847.3 ± 1.1 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0409 |
| Residual factor for significantly intense reflections | 0.0313 |
| Weighted residual factors for all reflections | 0.091 |
| Weighted residual factors for significantly intense reflections | 0.0844 |
| Goodness-of-fit parameter for all reflections | 0.985 |
| Goodness-of-fit parameter for significantly intense reflections | 1.002 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2005552.html
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Users of the data should acknowledge the original authors of the
structural data.