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Information card for entry 2005553
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Coordinates | 2005553.cif |
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Original IUCr paper | HTML |
Chemical name | Bis(1,2-bis(n-butylthioethylene)-1,2-dithiolato-S,S')-nickel |
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Formula | C20 H36 Ni S8 |
Calculated formula | C20 H36 Ni S8 |
SMILES | CCCCSC1=C(SCCCC)S[Ni]2(S1)SC(=C(S2)SCCCC)SCCCC |
Title of publication | A Second Triclinic Polymorph of Bis[1,2-bis(<i>n</i>-butylthio)ethylene-1,2-dithiolato-<i>S</i>,<i>S</i>']nickel |
Authors of publication | Charlton, A.; Kilburn, J. D.; Underhill, A. E.; Webster, M. |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1996 |
Journal volume | 52 |
Journal issue | 10 |
Pages of publication | 2441 - 2442 |
a | 8.7043 ± 0.001 Å |
b | 14.988 ± 0.002 Å |
c | 5.5288 ± 0.0006 Å |
α | 93.431 ± 0.011° |
β | 99.22 ± 0.009° |
γ | 100.388 ± 0.01° |
Cell volume | 697.37 ± 0.15 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0578 |
Residual factor for significantly intense reflections | 0.0343 |
Weighted residual factors for all reflections | 0.1047 |
Weighted residual factors for significantly intense reflections | 0.089 |
Goodness-of-fit parameter for all reflections | 1.067 |
Goodness-of-fit parameter for significantly intense reflections | 1.068 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2005553.html
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