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Information card for entry 2005553
Preview
| Coordinates | 2005553.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bis(1,2-bis(n-butylthioethylene)-1,2-dithiolato-S,S')-nickel |
|---|---|
| Formula | C20 H36 Ni S8 |
| Calculated formula | C20 H36 Ni S8 |
| SMILES | CCCCSC1=C(SCCCC)S[Ni]2(S1)SC(=C(S2)SCCCC)SCCCC |
| Title of publication | A Second Triclinic Polymorph of Bis[1,2-bis(<i>n</i>-butylthio)ethylene-1,2-dithiolato-<i>S</i>,<i>S</i>']nickel |
| Authors of publication | Charlton, A.; Kilburn, J. D.; Underhill, A. E.; Webster, M. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 10 |
| Pages of publication | 2441 - 2442 |
| a | 8.7043 ± 0.001 Å |
| b | 14.988 ± 0.002 Å |
| c | 5.5288 ± 0.0006 Å |
| α | 93.431 ± 0.011° |
| β | 99.22 ± 0.009° |
| γ | 100.388 ± 0.01° |
| Cell volume | 697.37 ± 0.15 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0578 |
| Residual factor for significantly intense reflections | 0.0343 |
| Weighted residual factors for all reflections | 0.1047 |
| Weighted residual factors for significantly intense reflections | 0.089 |
| Goodness-of-fit parameter for all reflections | 1.067 |
| Goodness-of-fit parameter for significantly intense reflections | 1.068 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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