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Information card for entry 2005767
Preview
| Coordinates | 2005767.cif |
|---|---|
| Original IUCr paper | HTML |
| Common name | Chlorotris(m-methoxyphenyl)Tin(IV) |
|---|---|
| Chemical name | Chlorotris(m-methoxyphenyl)Tin(IV) |
| Formula | C21 H21 Cl O3 Sn |
| Calculated formula | C21 H21 Cl O3 Sn |
| SMILES | O(c1cc([Sn](Cl)(c2cc(OC)ccc2)c2cc(OC)ccc2)ccc1)C |
| Title of publication | Chlorotris(<i>m</i>-methoxyphenyl)tin(IV) |
| Authors of publication | Wharf, I.; Lebuis, A.-M. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 12 |
| Pages of publication | 3025 - 3027 |
| a | 16.094 ± 0.001 Å |
| b | 16.094 ± 0.001 Å |
| c | 6.717 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 1506.7 ± 0.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 146 |
| Hermann-Mauguin space group symbol | R 3 :H |
| Hall space group symbol | R 3 |
| Residual factor for all reflections | 0.0246 |
| Residual factor for significantly intense reflections | 0.0244 |
| Weighted residual factors for all reflections | 0.0522 |
| Weighted residual factors for significantly intense reflections | 0.0521 |
| Goodness-of-fit parameter for all reflections | 1.049 |
| Goodness-of-fit parameter for significantly intense reflections | 1.048 |
| Diffraction radiation wavelength | 0.7093 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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