Information card for entry 2005768
| Chemical name |
(±)-1,11-dimethyl-3,9-dinitro-5,7-dihydrodibenz[c,e]oxepin |
| Formula |
C16 H14 N2 O5 |
| Calculated formula |
C16 H14 N2 O5 |
| SMILES |
c1(cc(N(=O)=O)cc2COCc3cc(N(=O)=O)cc(C)c3c12)C |
| Title of publication |
(±)-1,11-Dimethyl-3,9-dinitro-5,7-dihydrodibenz[<i>c</i>,<i>e</i>]oxepine |
| Authors of publication |
Roszak, A. W.; Williams, V. E.; Lemieux, R. P. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1996 |
| Journal volume |
52 |
| Journal issue |
12 |
| Pages of publication |
3190 - 3193 |
| a |
8.1693 ± 0.0005 Å |
| b |
21.7076 ± 0.0012 Å |
| c |
8.375 ± 0.0008 Å |
| α |
90° |
| β |
96.515 ± 0.009° |
| γ |
90° |
| Cell volume |
1475.6 ± 0.19 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.073 |
| Residual factor for significantly intense reflections |
0.0498 |
| Weighted residual factors for all reflections |
0.1691 |
| Weighted residual factors for significantly intense reflections |
0.1419 |
| Goodness-of-fit parameter for all reflections |
1.116 |
| Goodness-of-fit parameter for significantly intense reflections |
1.172 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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