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Information card for entry 2008016
Preview
| Coordinates | 2008016.cif |
|---|---|
| Original IUCr paper | HTML |
| Common name | Tetraphenylphosphonium tetrachloro[oxovanadate(V)] |
|---|---|
| Chemical name | Tetraphenylphosphonium tetrachloro[oxovanadate(V)] |
| Formula | C24 H20 Cl4 O P V |
| Calculated formula | C24 H20 Cl4 O P V |
| SMILES | [P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.[V](Cl)(=O)(Cl)(Cl)Cl |
| Title of publication | Tetraphenylphosphonium Tetrachlorooxovanadate(V) |
| Authors of publication | Wulff-Molder, Dirk; Meisel, Manfred |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1998 |
| Journal volume | 54 |
| Journal issue | 12 |
| Pages of publication | IUC9800068 |
| a | 12.5629 ± 0.0006 Å |
| b | 12.5629 ± 0.0006 Å |
| c | 7.6587 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1208.75 ± 0.14 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 85 |
| Hermann-Mauguin space group symbol | P 4/n :2 |
| Hall space group symbol | -P 4a |
| Residual factor for all reflections | 0.066 |
| Residual factor for significantly intense reflections | 0.036 |
| Weighted residual factors for all reflections | 0.097 |
| Weighted residual factors for all reflections included in the refinement | 0.08 |
| Goodness-of-fit parameter for all reflections | 1.155 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.144 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2008016.html
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Users of the data should acknowledge the original authors of the
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