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Information card for entry 2008372
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Coordinates | 2008372.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | μ-Oxo-bis-[N,N'-ehtylene-bis(2-thioacetophenonidenimine)iron(III)] |
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Formula | C36 H36 Fe2 N4 O S4 |
Calculated formula | C36 H36 Fe2 N4 O S4 |
SMILES | [Fe]123(Sc4c(C(=[N]2CC[N]3=C(c2c(S1)cccc2)C)C)cccc4)O[Fe]123Sc4ccccc4C(=[N]2CC[N]3=C(c2c(S1)cccc2)C)C |
Title of publication | μ-Oxo-bis[<i>N</i>,<i>N</i>'-ethylenebis(2-thioacetophenonidenimine)iron(III)] |
Authors of publication | Karsten, Peter; Strähle, Joachim |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 1999 |
Journal volume | 55 |
Journal issue | 4 |
Pages of publication | 488 - 489 |
a | 11.663 ± 0.004 Å |
b | 25.704 ± 0.005 Å |
c | 12.07 ± 0.004 Å |
α | 90° |
β | 103.856 ± 0.014° |
γ | 90° |
Cell volume | 3513.1 ± 1.8 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0909 |
Residual factor for significantly intense reflections | 0.0563 |
Weighted residual factors for all reflections | 0.194 |
Weighted residual factors for all reflections included in the refinement | 0.1514 |
Goodness-of-fit parameter for all reflections | 0.931 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.854 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2008372.html
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