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Information card for entry 2016326
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Coordinates | 2016326.cif |
---|---|
Structure factors | 2016326.hkl |
Original IUCr paper | HTML |
Chemical name | trans-(±)-Diethyl N,N'-(1,2-cyclohexane-1,2-diyl)bis(2-thiooxamate) |
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Formula | C14 H22 N2 O4 S2 |
Calculated formula | C14 H22 N2 O4 S2 |
SMILES | S=C(N[C@@H]1[C@@H](NC(=S)C(=O)OCC)CCCC1)C(=O)OCC.S=C(N[C@H]1[C@H](NC(=S)C(=O)OCC)CCCC1)C(=O)OCC |
Title of publication | Supramolecular structures of bis-thionooxalamic acid esters derived from (±)-cyclohexane-1,2-diamine and (±)-1,2-diphenylethylenediamine |
Authors of publication | Piotrkowska, Barbara; Połoński, Tadeusz; Gdaniec, Maria |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2007 |
Journal volume | 63 |
Journal issue | 12 |
Pages of publication | o693 - o696 |
a | 9.6438 ± 0.001 Å |
b | 9.6656 ± 0.0011 Å |
c | 10.3316 ± 0.0011 Å |
α | 85.068 ± 0.009° |
β | 63.887 ± 0.01° |
γ | 77.155 ± 0.009° |
Cell volume | 843.02 ± 0.18 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0319 |
Residual factor for significantly intense reflections | 0.0272 |
Weighted residual factors for significantly intense reflections | 0.0696 |
Weighted residual factors for all reflections included in the refinement | 0.0717 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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