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Information card for entry 2016327
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Coordinates | 2016327.cif |
---|---|
Structure factors | 2016327.hkl |
Original IUCr paper | HTML |
Chemical name | (±)-<i>N,N'</i>-diethyl (1,2-diphenylethane-1,2-diyl)bis(2-thiooxamate) |
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Formula | C22 H24 N2 O4 S2 |
Calculated formula | C22 H24 N2 O4 S2 |
SMILES | S=C(N[C@H]([C@@H](NC(=S)C(=O)OCC)c1ccccc1)c1ccccc1)C(=O)OCC.S=C(N[C@@H]([C@H](NC(=S)C(=O)OCC)c1ccccc1)c1ccccc1)C(=O)OCC |
Title of publication | Supramolecular structures of bis-thionooxalamic acid esters derived from (±)-cyclohexane-1,2-diamine and (±)-1,2-diphenylethylenediamine |
Authors of publication | Piotrkowska, Barbara; Połoński, Tadeusz; Gdaniec, Maria |
Journal of publication | Acta Crystallographica Section C |
Year of publication | 2007 |
Journal volume | 63 |
Journal issue | 12 |
Pages of publication | o693 - o696 |
a | 9.2414 ± 0.0004 Å |
b | 21.7781 ± 0.001 Å |
c | 11.4322 ± 0.0006 Å |
α | 90° |
β | 100.273 ± 0.004° |
γ | 90° |
Cell volume | 2263.96 ± 0.19 Å3 |
Cell temperature | 110 ± 0.2 K |
Ambient diffraction temperature | 110 ± 0.2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0439 |
Residual factor for significantly intense reflections | 0.0319 |
Weighted residual factors for significantly intense reflections | 0.0799 |
Weighted residual factors for all reflections included in the refinement | 0.0835 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2016327.html
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Users of the data should acknowledge the original authors of the
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